Semiconductor probe pin

[0001]FIG. 1 is a perspective view of a semiconductor probe pin showing my new design;

[0002]FIG. 2 is a front view thereof;

[0003]FIG. 3 is a rear view thereof;

[0004]FIG. 4 is a left side view thereof;

[0005]FIG. 5 is a right side view thereof;

[0006]FIG. 6 is an enlarged top view thereof;

[0007]FIG. 7 is an enlarged bottom view thereof; and,

[0008]FIG. 8 is an enlarged partial view indicated in FIG. 4 thereof.

[0009]The dot-dash broken line indicates the boundary of the enlarged partial view and forms no part of the claimed design.