USD1106482S1
Specimen analysis apparatus
Publication
Application
Classifications
IPC Classifications
CPC Classifications
Applicants
Arkray, Inc.
Inventors
Kenya Hara, Chiyong Kim, Kanako Ohashi
Abstract
Figures
Description
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[0009]The broken lines in the drawings are for the purpose of illustrating portions of the specimen analysis apparatus that form no part of the claimed design.
Claims
CLAIM
The ornamental design for a specimen analysis apparatus as shown and described.