HIROSE ELECTRIC CO., LTD.

[Problem] To provide a probe and a probe device that can be easily attached to and detached from circuit boards and make it possible to conduct testing of circuit boards or electronic components in an efficient manner. [Means of Solution] A first clamping piece 20 has first clamping portions 25 at one end located adjacent to the circuit board P that make contact with one surface of a circuit board P; a second clamping piece 30 has a second clamping portion 31 at one end located adjacent to the circuit board P that makes contact with the other surface of the circuit board; the first clamping piece 20 and second clamping piece 30 have operative portions 26, 32 at the other end located on the side distal from the circuit board P for receiving an operating force opposing a biasing force exerted by a biasing member 40.

[Problem] To provide test probes that are smaller and have, or are capable of having, shielding capability in a simple manner, as well as a test socket for use with said test probes. [Means of Solution] A test probe comprising a hollow outer casing made of an electrically conductive material, a resilient member installed within the outer casing in a manner permitting contraction and expansion in an axial direction, and contact members installed within the outer casing in a state of being constantly biased by the resilient member while partially protruding outside of the outer casing, wherein the probe is configured such that the outer casing includes a cylindrical main body portion extending in the axial direction and a shielding portion provided along the axial direction as a protrusion in a radial direction of the main body portion in part of the peripheral surface of the main body portion, or alternatively, such that the outer casing includes a cylindrical main body portion extending in the axial direction and a recessed portion provided along the axial direction as an indentation in a radial direction of the main body portion in part of the peripheral surface of the main body portion, and an end of the shielding portion and/or an end of a shielding member of another test probe to be coupled can be installed in the recessed portion.

To provide test probes with an increased path for current flow and a test socket having such test probes, involving a support of an electrically conductive material having a first face and a second face, first contact members provided adjacent to the first face of the support, and second contact members provided adjacent to the second face of the support. At least either one of the first contact members or second contact members is provided as a plurality of members, and a plurality of the first contact members and at least one second contact member, or a plurality of the second contact members and at least one first contact member, are electrically connected through the support.