KARL STORZ Imaging, Inc.

An imaging spectrometer and camera are disclosed including a prism that refracts incident light a spectral range for spectrographic analysis with a shortest wavelength (λ S ) and a longest wavelength (λ L ). A diffraction grating is aligned with the prism and diffracts the incident light. The refraction and diffraction for a set of diffraction orders used for the spectrographic analysis both increase a deflection angle of the incident light from an original optical axis. The spectral range spans greater than an octave such that λ L >2λ S . The refraction and diffraction are such that a second diffracted order of λ S does not overlap with a first diffracted order of wavelengths shorter than λ L . The second order diffraction for wavelengths between λ S and λ C , and the first order diffraction for wavelengths between λ C and λ L , are detected in different spatial regions to perform the spectrographic analysis from λ S to λ L .

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.

A hyperspectral imaging system includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a portion of the light to pass. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis of the second image plane, and a spatial image of the slit width is imaged along a second axis. A sensor at the second image plane detects the spectrally dispersed light. A rotating prism is located distally to the slit and rotates, thereby rotating the image at the first imaging plane so that the portion of the image transmitted into the spectrometer varies.

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.

An imaging spectrometer and camera are disclosed including a prism that refracts incident light a spectral range for spectrographic analysis with a shortest wavelength (λ S ) and a longest wavelength (λ L ). A diffraction grating is aligned with the prism and diffracts the incident light. The refraction and diffraction for a set of diffraction orders used for the spectrographic analysis both increase a deflection angle of the incident light from an original optical axis. The spectral range spans greater than an octave such that λ L >2λ S . The refraction and diffraction are such that a second diffracted order of λ S does not overlap with a first diffracted order of wavelengths shorter than λ L . The second order diffraction for wavelengths between λ S and λ C , and the first order diffraction for wavelengths between λ C and λ L , are detected in different spatial regions to perform the spectrographic analysis from λ S to λ L .

A hyperspectral imaging system includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a portion of the light to pass. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis of the second image plane, and a spatial image of the slit width is imaged along a second axis. A sensor at the second image plane detects the spectrally dispersed light. A rotating prism is located distally to the slit and rotates, thereby rotating the image at the first imaging plane so that the portion of the image transmitted into the spectrometer varies.

A hyperspectral imaging device includes an optical channel arranged to focus light at a first image plane. A spectrometer includes a slit formed at the first image plane to allow a slit-shaped portion of the light pass through. A dispersive element receives light from the slit and spectrally disperses it along a direction perpendicular to a width of the slit. A focusing lens focuses the spectrally dispersed light at a second image plane such that the spectral dispersion is imaged along a first axis thereof, and a spatial image of the slit width is imaged along a second axis for detection by a sensor. A sliding lens group between the optical channel and the first image plane moves to direct the incident light, scanning the entire image over the slit such that multiple frames acquired by the sensor each correspond to a horizontal line of the image.