Company patents

KCTECH CO., LTD.

KCTECH CO., LTD. shows a surprising shift in its patent strategy, with a significant decline in its core Semiconductor Manufacturing Process patents, which represent 37.9% of its portfolio, experiencing a -90.0% YoY drop so far in 2026 after a +233.3% surge in 2025. Concurrently, Functional Materials (LCD, Lubricants) emerged as a rapidly growing focus in 2025 with a +300.0% YoY increase, despite a -75.0% decline so far in 2026, indicating a dynamic and potentially volatile innovation landscape for the company.

Patent Trend by Technology Area

Yearly patent publications since 2023

Product themes

Product-level themes inferred from filings since 2023, with category chips showing where each theme appears. Select a theme to filter the patents below.

66 US filings (since 2023) · 8 categories · 13 themes

Chemical Mechanical Planarization & Wet Surface Treatment

Processes involving chemical and mechanical forces to planarize surfaces (CMP) or wet chemical treatments for cleaning, etching, or material removal, often utilizing specialized compositions, nozzles, or fluid management systems.

Semiconductor Manufacturing Process
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33since 2023
+220.0%YoY
CMP Slurry Formulations

Abrasive slurry compositions used in semiconductor manufacturing for planarizing wafer surfaces, typically containing abrasive particles and chemical additives to achieve specific material removal rates and selectivity.

Functional Materials (LCD, Lubricants)
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29since 2023
+180.0%YoY
CMP Pad & Slurry Chemistry

Focuses on the chemical and physical properties of polishing slurries and the design of polishing pads, including their material composition, groove patterns, and thermal characteristics, to optimize chemical-mechanical planarization processes.

Grinding & Polishing
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29since 2023
+116.7%YoY
Post-Processing Cleaning & Conditioning

Methods and apparatus for cleaning polishing pads, dressers, chamber components, or finished substrates to remove residues, debris, or contaminants, often involving specialized nozzles, fluids, or mechanical actions.

Grinding & Polishing
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26since 2023
+60.0%YoY
Precision Substrate and Wafer Cleaning

Specialized cleaning techniques and apparatus designed for removing microscopic contaminants, residues, or films from sensitive substrates, such as semiconductor wafers or flat panel displays, often involving chemical, mechanical, or plasma-based methods.

Cleaning Processes
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19since 2023
+66.7%YoY
Wafer Handling and Process Environment Control

Systems and methods for automated substrate transport, precise positioning, temperature regulation, and chamber environment management to ensure process stability, uniformity, and yield in semiconductor manufacturing.

Semiconductor Manufacturing Process
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11since 2023
+50.0%YoY
Specialty Solvents and Coolants

Formulated liquid compositions designed for specific industrial applications, such as non-flammable cleaning, thermal management in electronics, or as low-viscosity, high-flash-point base fluids.

Functional Materials (LCD, Lubricants)
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5since 2023
new
Sensor and Component Surface Cleaning

Technologies for removing contaminants from critical surfaces of sensors, vehicle parts, or industrial components, often involving automated or semi-automated processes. This can include physical, acoustic, or fluid-based methods to maintain functionality.

Cleaning Processes
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4since 2023
n/a
Liquid Crystal Compositions

Mixtures of liquid crystal compounds and other additives, such as monomers or carbon black, designed to achieve specific optical, electrical, or physical properties for use in liquid crystal displays (LCDs) or other electro-optical devices.

Functional Materials (LCD, Lubricants)
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2since 2023
new
Automated Grinding & Polishing Systems

Integration of robotics, sensors, and control systems to automate the grinding, polishing, or deburring process, including workpiece handling, tool adjustment, and system maintenance for improved efficiency and precision.

Grinding & Polishing
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1since 2023
n/a
Precision Surface Metrology & Control

Techniques and devices for measuring, monitoring, and controlling the surface topography, film thickness, or other characteristics of a workpiece during or after grinding/polishing to achieve specific finish requirements.

Grinding & Polishing
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1since 2023
n/a
Advanced Material Characterization

Techniques and systems for precisely measuring electrical or electromagnetic properties of materials or components, often involving specialized resonators, waveguides, or multi-range measurement systems to ensure accuracy.

Semiconductor Testing
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1since 2023
n/a
Wafer Bonding & Stacked Device Inspection

Inspection and testing methods specifically designed for wafers before, during, or after bonding processes, including verification of bonding surfaces, alignment, and defect detection in multi-wafer or stacked die assemblies.

Semiconductor Testing
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1since 2023
n/a

Patents

Showing 81-90 of 98

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