NATIONAL INSTRUMENTS CORPORATION

A planar transformer includes a core, a first circuit, a second circuit, and a primary conductive shield. The first circuit includes two or more primary windings that are stacked in two or more layers and are magnetically coupled to the core. The second circuit includes a rectifier circuit and two or more secondary windings that are magnetically coupled to the core. The primary conductive shield is stacked between a first primary winding of the two or more primary windings and a first secondary winding of the two or more secondary windings. The primary conductive shield reduces a capacitive coupling between the first primary winding and the first secondary winding.

A matrix switching workflow allows for extending the virtual device configuration associated with a given single (test) site to multiple (test) sites, and expanding use of a single functional test program/sequence from a single site to multiple sites. Virtual device and connection support in a pin map editor enables mapping between switched instrument channels and switched device under test (DUT) pins on multiple sites, eliminating additional editing work. A switched channels section in a front test program design panel may list fully qualified channel connections to pins configured to a matrix switch. Configurations may be exported based on pin names and not based on the switch channel connection so that the configuration may be applied to switched instrument channels based on the specified pins. In order to avoid entering route/route-group names in the pin map, a specific route/route-group naming scheme may be used.

Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.

Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.

A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.

Methods and systems for performance assessment of a multichannel signal generator including a plurality of transmit channels. Configuration information is sent to the multichannel signal generator. An amplitude and phase is determined for a plurality of tones, and the tones are distributed over the transmit channels. Each transmit channel generates a periodic modulated signal comprising its respective tone. The generated periodic modulated signals are combined in a combined signal. The amplitudes and phases are determined so that the combined signal has a crest factor below a given threshold level. The combined signal is measured, based on the configuration information, and aligned relative to a reference combined signal. Individual tones are extracted from the aligned combined signal, and a relative delay and/or a phase offset is determined for at least two transmit channels by comparing the extracted individual tones with corresponding individual tones extracted from the reference combined signal.

Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.

In some embodiments, a method for synchronizing radio frequency (RF) devices can include receiving, a first stimuli signal including a maker signal from a first RF device and an output signal from a second RF device, wherein the output signal can be based at least in part on a second stimuli signal including a pulse waveform transmitted from the first RF device to the second RF device. The method can include digitizing the pulse waveform, measuring delay values between a first sample of the first stimuli signal and the digitized pulse waveform, and adjusting a timing of the marker signal. The method can include performing one or more pulse delay measurements associated with the first stimuli signal and the output signal as well as calculating a trigger delay. The method can also include performing, using the trigger delay, one or more measurements associated with a device under test (DUT).

A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.

An apparatus for securely retaining a high voltage (e.g., greater than 1000 volts) banana plug can include a clamshell apparatus. The clamshell apparatus can include a first segment that includes a one or more mating pegs and a first threaded portion and a second segment that includes one or more mating slots and a second threaded portion. The first segment and the second segment can be configured to be assembled via a press-fit of the first segment to the second segment over a banana plug. In addition, when assembled, the first threaded portion and the second threaded portion are aligned to form a threaded fastener that is configured to retain the banana plug in a banana socket when engaged with a corresponding mating flange via the threaded fastener.