Rigaku Corporation

A calculation apparatus for calculating a correlation function from a structural model comprises a structural model acquiring section for acquiring the structural model including a plurality of types of atoms in space, an atomic species setting section for setting a specific atomic species in the structural model, and a correlation function calculating section for calculating the correlation function that is a ratio between a first radial distribution function and a second radial distribution function, wherein the first radial distribution function is a radial distribution function between atoms of the specific atomic species and atoms of the specific atomic species, and the second radial distribution function is a radial distribution function between atoms of the specific atomic species and atoms of two or more types of atomic species including the specific atomic species.

A control apparatus, a Kratky block, a control method and a control program capable of suppressing parasitic scattering and GISAXS scattering caused by the Kratky block are provided. A control apparatus for controlling an X-ray analysis apparatus for a laboratory and acquiring an X-ray scattering image of a molecule with the size of the 1000 Å order comprises an arrangement condition setting section for setting an arrangement condition including an opening degree and a height of a Kratky block, an arrangement controlling section for controlling the Kratky block so as to satisfy the arrangement condition, a data acquiring section for acquiring detected X-ray intensity data in each controlled arrangement and an arrangement condition determining section for determining an arrangement condition inducing the smallest effect of scattering by the Kratky block based on the acquired X-ray intensity data.

An X-ray inspection apparatus and an X-ray inspection system capable of observing a sample using a detector suitable for each application are provided in a single apparatus. An X-ray source for irradiating parallel X-rays with a plate-shaped sample, a sample stage for holding the sample, a plurality of detectors each having a different resolution and detecting a projection image of X-rays transmitted through the sample, a switching mechanism for switching the detectors, and an adjusting mechanism for adjusting an arrangement of each of the detectors independently are comprised, and the adjusting mechanism enables each of the detectors to move in a direction close to or away from the sample along an optical axis of the irradiated X-rays.

A calculation apparatus, a calculation method, a program, and a machine-learning model generating method for inferring a lattice volume from a profile of X-ray powder diffraction includes an information acquiring section for acquiring information on the profile of X-ray powder diffraction and an inference section for inferring the lattice volume from the acquired information on the profile of X-ray powder diffraction, the inference section including a machine-learning model for inputting information on the profile of X-ray powder diffraction and outputting the inferred lattice volume.

Measurement can be performed even when spaces divided by a partition film have a pressure difference therebetween, and the partition film is easily extended without causing warping and wrinkles. Provided is an X-ray fluorescence spectrometer, which includes: an irradiation chamber; and a sample chamber, the X-ray fluorescence spectrometer including: a window frame holding member; and a window frame member, which is configured to hold a partition film. The window frame member includes: an inner film holding member including a peripheral wall extending from a proximal end; and an outer film holding member, the outer film holding member being configured to be inserted from the distal end of the inner film holding member to be mounted to the proximal end of the inner film holding member so as to fix a surrounding of the part of the partition film to the inner film holding member.

The correction apparatus comprises a projection image acquiring section for acquiring a measured projection image, a virtual energy setting section for setting a virtual energy different from the measured energy that is the energy of the X-ray irradiated at the time of acquiring the measured projection image, a dual energy decomposing section for calculating a projection image under an assumed condition at the time of irradiating the X-ray of the virtual energy and performing dual energy decomposition, a consistency index evaluating section for evaluating a temporarily corrected image obtained by the dual energy decomposition with a consistency index to identify an optimum condition among the assumed conditions, and a correction image generating section for generating a projection image under the optimum condition as a corrected image.

To prevent an intensity of fluorescent X-rays to be detected from being reduced, to achieve high analytical accuracy and short measurement time, provided is an X-ray fluorescence spectrometer, which includes: a sample chamber in which a sample is to be arranged; and an irradiation chamber divided from the sample chamber by a partition wall, the X-ray fluorescence spectrometer including: an X-ray source arranged in the irradiation chamber; window frame member configured to hold a partition film; and a film supporting member having an elongated hole for allowing the X-rays to pass therethrough, the film supporting member being arranged adjacent to the irradiation chamber side of the partition film to support the partition film. In plan view as viewed from the sample chamber side toward the irradiation chamber side, the film supporting member is arranged so that the elongated hole is parallel to an optical axis of the X-rays.

A system that can reduce the cost for correcting artifacts due to motion in the reconstruction of CT images includes acquiring the temporarily corrected projection image and determining the reference center position correction function and the parameter of the temporary reference center position correction function by calculating a degree of coincidence between the temporarily corrected projection image and the projection image at the imaging angle opposing thereto, and correcting the main imaging data or the projection image based on the main imaging data using the reference center position correction function and the relative motion correction function.

Obtaining an X-ray CT image of a biological sample includes a step of penetrating a contrast agent into the biological sample and solidifying the contrast agent to provide a contrast image of the biological sample, the contrast agent comprising wax and having a density of 0.95 g/cm 3 or less in its solidified state after penetration into the biological sample, and having a melting point of 40° C. to 80° C., a step of melting and resolidifying the solidified contrast agent, and a step of acquiring an X-ray CT image by irradiating the resolidified biological sample with an X ray having an energy of 4 to 12 keV, the shape of the biological sample being a shape with which a maximum optical path length of the X ray in the biological sample in the step of acquiring an X-ray CT image is 2 mm or less.

In an automatic setting by an X-ray fluorescence spectrometer of the present invention, overlap correction coefficients are limited to negative values, and absorption/excitation correction coefficients are such that, in a case where standard samples do not contain components capable of exciting analytical lines, the absorption/excitation correction coefficients for all correction components are limited to positive values, theoretical intensities of fluorescent X-rays to be generated from samples of which compositions have been assumed are calculated, theoretical matrix correction coefficients are obtained on the basis of the theoretical intensities, and a numerical value obtained by multiplying each theoretical matrix correction coefficient by a predetermined number is, in a case of a positive numerical value, set as an upper limit value of the absorption/excitation correction coefficient or is, in a case of a negative numerical value, set as a lower limit value of the absorption/excitation correction coefficient, to perform multiple regression calculation.