Company patents

Siemens Industry Software NV

Siemens Industry Software NV maintains a strong focus on Electronic Design Automation (CAD/EDA), representing 43.1% of its portfolio, despite a significant decline of 57.1% in patent filings so far in 2026 for this category. Surprisingly, the company showed an emerging focus on Machine Learning & AI, with a remarkable 300.0% year-over-year growth in 2024, indicating a strategic shift towards integrating advanced AI capabilities into its software offerings.

Patent Trend by Technology Area

Yearly patent publications since 2023

Product themes

Product-level themes inferred from filings since 2023, with category chips showing where each theme appears. Select a theme to filter the patents below.

51 US filings (since 2023) · 12 categories · 12 themes

Component Performance Optimizationfiltered

Using computational design and simulation to optimize the performance characteristics of specific components or materials within a larger engineering system.

Electronic Design Automation (CAD/EDA)
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24since 2023
+14.3%YoY
Digital Twin & System Simulation

Creating virtual models (digital twins) of complex physical systems to simulate their behavior, predict performance, validate designs, or guide operations under various conditions.

Electronic Design Automation (CAD/EDA)
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10since 2023
-20.0%YoY
AM Part Design & Topology Optimization

Computational methods and design principles for generating optimized geometries, internal structures (e.g., lattices, minimal surfaces), or functional features that are specifically enabled or enhanced by the capabilities of additive manufacturing.

Additive Manufacturing (3D Printing)
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7since 2023
+100.0%YoY
Autonomous System Redundancy & Validation

Techniques and architectures for ensuring the reliability, fault tolerance, and performance validation of autonomous driving systems, including redundant computing platforms and perception system monitoring.

Vehicle Control Systems
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6since 2023
0.0%YoY
Vehicle Telematics & Diagnostics

Technologies for monitoring vehicle performance, detecting faults, collecting operational data, and providing remote assistance or automated control based on sensor inputs and network connectivity.

Time / Attendance / Access Control
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6since 2023
-75.0%YoY
AI/ML for Industrial Process Optimization

Applying machine learning and artificial intelligence models to analyze industrial data, predict system behavior, and optimize control strategies for improved efficiency, quality, or environmental compliance in manufacturing and operations.

Industrial Control Systems
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4since 2023
new
AM Process Monitoring & Control

Systems and methods for real-time sensing, modeling, and closed-loop control of additive manufacturing parameters to ensure part quality, consistency, and process efficiency. This includes thermal management, atmospheric regulation, and precise material deposition.

Additive Manufacturing (3D Printing)Industrial Control Systems
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4since 2023
n/a
Photolithography Process Modeling

Computational methods for modeling and simulating photolithography processes, including mask design, aerial image generation, and defect prediction for semiconductor manufacturing.

Electronic Design Automation (CAD/EDA)
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3since 2023
+100.0%YoY
Autonomous Fleet & Task Management

Systems for coordinating and controlling fleets of autonomous vehicles or machines, including task allocation, route optimization, and monitoring their operational status and progress.

Time / Attendance / Access Control
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2since 2023
0.0%YoY
Metal Additive Manufacturing Processes

Techniques for building three-dimensional metal objects layer-by-layer using metal powders, including powder bed fusion, binder jetting, and directed energy deposition. This theme encompasses process mechanics, equipment design, and operational control for AM systems.

Additive Manufacturing (3D Printing)Electronic Design Automation (CAD/EDA)
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2since 2023
n/a
Electronic System Layout & Integration

Automated methods and tools for generating, optimizing, and verifying the physical layout and interconnections of electronic components, including integrated circuits, printed circuit boards, and system-level interface protection.

Electronic Design Automation (CAD/EDA)
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2since 2023
n/a
Acoustic and Vibration Diagnostics

Utilizing sound and vibration analysis to detect malfunctions, assess balance, or monitor the operational health of machinery and structures. This often involves sensors, signal processing, and pattern recognition.

Machine Testing
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2since 2023
n/a

Patents

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US 20250045487 A1APPLICATION
G06F30/23

METHOD OF DETERMINING ACOUSTIC PARAMETERS OF AN OBJECT'S EMISSION, COMPUTER PRODUCT, SYSTEM

Filed:2022-10-07Pub:2025-02-06
Applicant:Siemens Industry Software NV

Method of determining acoustic parameters of an object's (OBJ) emission and/or scattering, in particular for improving acoustic properties of said object (OBJ), comprising: (a) defining a model (MDL) including said object (OBJ), a sound source (SCR), and a surrounding area, (b) processing said model (MDL) obtaining a result (RST), (c) post-processing the result (RST) by assigning to said field points (PTS) at least one parameter (PRM) determined from calculating the Helmholtz-Kirchhoff integral from said result (RST). To improve the accuracy and efficiency the post-processing comprises the additional steps: (d) identifying field points (PTS) as near field singularity field points (NEP) of potential lower result (RST) accuracy (ACR), (c) determining for said near field singularity field points (NEP) respectively an associated model mesh element (AME), by determining a local projection from said near field singularity field point (NEP) to the object's (OBJ) surface by calculating a minimum normal distance (MND) to the object's (OBJ) surface, wherein the associated model mesh element (AME) being the touchdown point of the local projection, (f) determining for said near field singularity field points (NEP) respectively a ratio (RTO) of the minimum normal distance (MND) to said element size (ESZ) of the associated model mesh element (AME), (g) calculating the Helmholtz-Kirchhoff integral by: (g11) providing a relation (PCR) of quadrature order (QOD) and said ratio (RTO), (g2) determine the respective quadrature order (QOD) by applying said relation (PCR), (g3) calculating the Helmholtz-Kirchhoff integral from said result (RST).