VAREX IMAGING CORPORATION

An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.

Technology is described for a system for symmetric readout from an asymmetric split flat panel image detector. The system may include an odd number of gate drivers to supply image data signals from an image detector with asymmetrically split partitions. A gate controller may control the image data signals from the odd number of gate drivers. A virtual gate driver, associated with the gate controller, may provide dummy data that is supplemental symmetric row data to be combined with image data signals from the odd number of gate drivers of the image detector. A data capture module may capture symmetric image data including dummy data as received using the gate controller.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.

Some embodiments include an x-ray system, comprising: a housing; a plurality of overlapping imaging layers disposed in the housing, each imaging layer configured to generate an image in response to a corresponding incident x-ray beam; and a plurality of x-ray markers attached to the housing and disposed to affect the incident x-ray beam for each of the imaging layers.

Some embodiments include an x-ray system, comprising: an x-ray imager including a plurality of imaging layers; an x-ray source configured to generate an x-ray beam; and an x-ray prefilter; wherein: the x-ray prefilter is configured to adjust an energy spectrum of the x-ray beam to create or decrease a level of x-ray fluence of a local minimum between two of a plurality of local maximums.

Some embodiments include a system, comprising: a housing; an imaging array disposed within the housing; an imaging strip disposed within the housing; a first readout circuit coupled to the imaging array; a second readout circuit coupled to the imaging strip; and common electronics coupled to the first readout circuit and the second readout circuit and configured to generate image data in response to at least one of the first readout circuit and the second readout circuit.

An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.

Some embodiments include a system, comprising: a housing; an imaging array disposed within the housing; an imaging strip disposed within the housing; a first readout circuit coupled to the imaging array; a second readout circuit coupled to the imaging strip; and common electronics coupled to the first readout circuit and the second readout circuit and configured to generate image data in response to at least one of the first readout circuit and the second readout circuit.

Some embodiments include a system, comprising: an integrating detector including a plurality of pixels, each pixel configured to integrate signal from photons of a radiation beam; and an energy sensing detector overlapping the plurality of pixels of the integrating detector and configured to generate energy information in response to the radiation beam.