Company patents

ACM RESEARCH (SHANGHAI), INC.

ACM RESEARCH (SHANGHAI), INC. demonstrates a strong, albeit fluctuating, focus on core semiconductor manufacturing, with Semiconductor Manufacturing Process patents representing 63.4% of its portfolio and experiencing a significant surge in 2024 (YoY +266.7%). While there's a clear emphasis on manufacturing-related Cleaning Processes (22.5% of portfolio), the company also shows an emerging, albeit smaller, interest in Coating & Surface Treatment, which saw a 100.0% YoY growth in 2025 and maintained its patent output so far in 2026.

Patent Trend by Technology Area

Yearly patent publications since 2023

Product themes

Product-level themes inferred from filings since 2023, with category chips showing where each theme appears. Select a theme to filter the patents below.

71 US filings (since 2023) · 8 categories · 9 themes

Precision Substrate and Wafer Cleaning

Specialized cleaning techniques and apparatus designed for removing microscopic contaminants, residues, or films from sensitive substrates, such as semiconductor wafers or flat panel displays, often involving chemical, mechanical, or plasma-based methods.

Cleaning Processes
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36since 2023
-33.3%YoY
Wafer Handling and Process Environment Control

Systems and methods for automated substrate transport, precise positioning, temperature regulation, and chamber environment management to ensure process stability, uniformity, and yield in semiconductor manufacturing.

Semiconductor Manufacturing Process
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26since 2023
-25.0%YoY
Substrate Patterning & Processingfiltered

Methods and equipment for applying photoresist uniformly onto wafers, forming patterns through various exposure techniques (e.g., direct imaging, multi-exposure), and integrating patterned layers into semiconductor structures or packaging.

Photolithography
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26since 2023
-50.0%YoY
Advanced Etching & Patterning Control

Techniques for precise material removal, pattern shaping, and controlling etch selectivity or uniformity, often involving plasma, wet chemistry, or directed beams to achieve desired features on semiconductor substrates.

Semiconductor Manufacturing Process
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7since 2023
-60.0%YoY
Advanced Deposition Chamber Hardware

Design and engineering of specialized components within deposition systems, such as heaters, targets, susceptors, and chamber walls, to achieve precise control over process parameters like temperature, material flux, and plasma characteristics.

Coating & Surface Treatment
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5since 2023
new
Chemical Mechanical Planarization & Wet Surface Treatment

Processes involving chemical and mechanical forces to planarize surfaces (CMP) or wet chemical treatments for cleaning, etching, or material removal, often utilizing specialized compositions, nozzles, or fluid management systems.

Semiconductor Manufacturing Process
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4since 2023
0.0%YoY
Conformal & Selective Film Deposition

Methods for depositing thin films with controlled conformality, thickness, and material properties, including selective deposition on specific areas, often using atomic layer deposition (ALD), chemical vapor deposition (CVD), or epitaxial growth.

Coating & Surface Treatment
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3since 2023
+100.0%YoY
Temporary Wafer Bonding & Debonding

Methods for temporarily attaching a wafer or substrate to a carrier for thinning, dicing, or other processing, followed by controlled debonding, often using light-sensitive resins, temporary adhesives, or roughened interfaces.

Semiconductor Manufacturing Process
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2since 2023
0.0%YoY
Advanced Photoresist Materials

Development of novel chemical compositions for photoresists, including polymers, sensitizers, and crosslinking agents, to achieve improved lithographic performance such as resolution, sensitivity, line edge roughness, and etch resistance.

Photolithography
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1since 2023
n/a

Patents

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US 20250198039 A1APPLICATION
C25D17/00

ELECTROPLATING APPARATUS

Filed:2023-03-21Pub:2025-06-19
Applicant:ACM RESEARCH (SHANGHAI), INC.

The present invention discloses an electroplating apparatus, comprising: a membrane frame, the center of which is provided with a through hole; transport branch pipes, extending from the side wall of the through hole of the membrane frame to the edge of the membrane frame; a plating solution buffer structure, comprising a central cap and a flow stabilizing sleeve, the central cap being provided on the through hole of the membrane frame and covering the through hole; a plurality of first holes being formed on the top of the central cap, the flow stabilizing sleeve being fixed below the central cap and inserted in the through hole of the membrane frame, and at least one second hole being formed in the side wall of the flow stabilizing sleeve; and a diffusion plate being fixed to the top of the membrane frame and provided with a plurality of third holes. A cathode plating solution flows into the space between the flow stabilizing sleeve and the side wall of the through hole through the transport branch pipes, then enters the interior of the flow stabilizing sleeve through the second holes on the side wall of the flow stabilizing sleeve, and then is supplied to the diffusion plate through the first holes in the central cap and reaches the substrate through the third holes. The present invention can buffer the flow speed of the fluid, thus effectively solving the problem of differentiation between the center and the edge of the substrate to be electroplated, and improving the quality of the electroplating product.