Company patents

MKS Instruments, Inc.

MKS Instruments, Inc. shows a surprising shift in its patent strategy, with its dominant category, Electron / Ion Tubes & Discharge (51.6% of portfolio), experiencing a significant 55.0% decline in patenting in 2025. Concurrently, while several smaller categories like Impedance Networks and Coating & Surface Treatment saw sharp declines of 100.0% in 2025, Flow / Volume Measurement emerged as a rapidly growing focus with a 66.7% increase in 2025, indicating a potential pivot towards manufacturing measurement technologies.

Patent Trend by Technology Area

Yearly patent publications since 2023

Product themes

Product-level themes inferred from filings since 2023, with category chips showing where each theme appears. Select a theme to filter the patents below.

95 US filings (since 2023) · 12 categories · 20 themes

RF Plasma Power Delivery

Systems and methods for delivering radio frequency (RF) power to plasma processing chambers, including impedance matching, pulse shaping, and feedback control for stable and efficient plasma generation.

Electron / Ion Tubes & Discharge
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49since 2023
-57.1%YoY
Plasma Process Chamber Engineering

Design and control of plasma processing chambers, including heating, gas delivery, electrode configurations, and magnetic field control for uniform and efficient material processing in semiconductor manufacturing.

Electron / Ion Tubes & Discharge
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34since 2023
-73.3%YoY
Differential & Dynamic Pressure Sensing

Systems and sensors designed to measure the pressure difference between two distinct points or to capture rapid, transient pressure fluctuations in fluid or gas systems, often using diaphragms or pistons.

Force / Pressure Measurement
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17since 2023
-90.0%YoY
Flowmeter Design & Diagnostics

Innovations in the construction, integration, and operational verification of flow measurement devices, including methods for calibration, fault detection, and structural integrity monitoring.

Flow / Volume Measurement
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12since 2023
-20.0%YoY
In-situ Coating Process Diagnostics

Methods and systems for real-time monitoring and control of coating processes or chamber cleaning, utilizing sensor data (e.g., thermal, pressure, optical) and predictive models to ensure quality and optimize efficiency.

Coating & Surface Treatment
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10since 2023
-50.0%YoY
Ion Implantation Control & Metrology

Methods and apparatus for precise wafer positioning, ion beam uniformity, and dose monitoring during ion implantation processes in semiconductor device manufacturing.

Electron / Ion Tubes & Discharge
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9since 2023
-66.7%YoY
Resistive & Piezoresistive Strain Gauges

Sensors that quantify strain or deformation by measuring the change in electrical resistance of a material, such as a semiconductor film or conductive layers, as it undergoes mechanical stress.

Force / Pressure Measurement
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8since 2023
-80.0%YoY
Impedance Matching Networks

Circuits designed to transform the impedance of a source to match the impedance of a load, maximizing power transfer or minimizing signal reflections, often involving inductors, capacitors, and transformers.

Impedance Networks (Filters, Resonators)
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8since 2023
-50.0%YoY
Integrated Valve Sensing & Diagnostics

Incorporating sensors and processing capabilities directly into valve systems to monitor operational state, detect malfunctions, measure flow parameters, or verify proper installation.

Valves
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7since 2023
+200.0%YoY
Advanced Deposition Chamber Hardware

Design and engineering of specialized components within deposition systems, such as heaters, targets, susceptors, and chamber walls, to achieve precise control over process parameters like temperature, material flux, and plasma characteristics.

Coating & Surface Treatment
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7since 2023
n/a
Vacuum System & Chamber Evacuation

Techniques and apparatus for achieving and maintaining vacuum conditions within charged particle and plasma processing chambers, including pump control, vacuum degree monitoring, and chamber sealing.

Electron / Ion Tubes & Discharge
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6since 2023
-66.7%YoY
Quantum Control Circuits

Specialized digital and mixed-signal circuits for controlling and reading out quantum bits (qubits), including generating precise modulated RF signals and integrating with photonic components for quantum operations.

Pulse / Digital Logic Circuits
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5since 2023
-33.3%YoY
Multiphase Fluid Measurement

Technologies for measuring the flow rate, level, or composition of mixtures containing multiple fluid phases (e.g., liquid-liquid, liquid-gas, liquid-solid suspensions), often employing specialized sensing principles to differentiate components.

Flow / Volume Measurement
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4since 2023
new
Precision Dosing & Targeted Spraying

Systems and methods for accurately controlling the volume, location, and characteristics of sprayed fluids, often involving sensors, feedback, or specific nozzle geometries for precise application.

Flow / Volume Measurement
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3since 2023
new
Control & Stability for Power Converters

Techniques and circuits designed to regulate output, manage input variations, mitigate resonance, or ensure stable operation of power converters under diverse load and source conditions. This includes adaptive, predictive, or fault-tolerant control schemes.

Power Conversion (DC/AC, DC/DC)
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3since 2023
-50.0%YoY
Advanced Biomarker Detection Assays

Methods and compositions for identifying, quantifying, or characterizing specific biological molecules (e.g., nucleic acids, proteins, metabolites, antibodies) or microbial species, often for diagnostic, prognostic, or quality control applications.

Material & Chemical Analysis
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2since 2023
new
Advanced Valve Actuation

Mechanisms and control systems for precisely moving valve elements, often involving electric motors, cams, solenoids, or pneumatic/hydraulic pilots, to achieve desired flow or position.

Valves
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2since 2023
n/a
Advanced Power Converter Topologies

Focuses on novel circuit configurations for DC-DC, DC-AC, or AC-DC conversion, often involving resonant operation, multi-level structures, or switched capacitors to improve efficiency, power density, or voltage conversion ratios.

Power Conversion (DC/AC, DC/DC)
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2since 2023
n/a
Precision Substrate and Wafer Cleaning

Specialized cleaning techniques and apparatus designed for removing microscopic contaminants, residues, or films from sensitive substrates, such as semiconductor wafers or flat panel displays, often involving chemical, mechanical, or plasma-based methods.

Cleaning Processes
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2since 2023
n/a
Valves for Sanitary & HVAC Systems

Specialized valve designs for domestic and commercial applications involving water distribution, temperature control, and air conditioning, often focusing on integration, materials, and specific flow characteristics.

Valves
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1since 2023
n/a

Patents

Showing 51-60 of 164

Page 6 of 17
US 20230369033 A1APPLICATION
H01J37/32

Methods and Systems for Feedback Control in Plasma Processing Using Radical Sensing

Filed:2022-11-09Pub:2023-11-16
Applicant:MKS Instruments, Inc.

An apparatus for feedback control in plasma processing systems using radical sensing, and a method for feedback control in plasma processing systems using radical sensing, the apparatus comprising at least one process gas supply system configured to output at least one process gas, at least one plasma source configured to receive the at least one process gas and generate at least one radical flow, at least one process chamber in communication with the at least one plasma source, wherein the process chamber receives the at least one radical flow and directs at least a portion of the at least one radical flow to one or more devices, the process chamber configured to output at least one process chamber output, at least one gas analyzer in communication with and configured to sample at least one of the at least one process gas, at least one radical flow, at least one radical flow within the at least one process chamber, and the at least one process chamber output, and at least one controller in communication with at least one of the process gas supply system, at least one plasma source, and at least one process chamber, the controller configured to generate at least one control signal based on data from the at least one gas analyzer and selectively control at least one of the process gas supply system, at least one plasma source, and at least one process chamber.

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