Company patents
NATIONAL INSTITUTE OF METROLOGY, CHINA
NATIONAL INSTITUTE OF METROLOGY, CHINA exhibits a surprisingly diversified patent strategy, with its top three categories—Length / Distance Measurement, Electrical Measurement, and Material & Chemical Analysis—each accounting for an equal 13.8% of its 58-patent portfolio. Despite this, several key areas show shifting priorities, such as Length / Distance Measurement experiencing a significant decline of -100.0% in 2025, and Electrical Measurement seeing a -60.0% drop in 2025 and -50.0% so far in 2026, indicating a potential re-evaluation of focus within these foundational metrology areas.
Patent Trend by Technology Area
Yearly patent publications since 2023
Product themes
Product-level themes inferred from filings since 2023, with category chips showing where each theme appears. Select a theme to filter the patents below.
58 US filings (since 2023) · 12 categories · 17 themes
Techniques and systems for precisely measuring electrical or electromagnetic properties of materials or components, often involving specialized resonators, waveguides, or multi-range measurement systems to ensure accuracy.
Methods and apparatus for precise wafer positioning, ion beam uniformity, and dose monitoring during ion implantation processes in semiconductor device manufacturing.
Systems and methods for preparing, organizing, and electrically connecting individual conductors or cable bundles to connector terminals, ensuring reliable contact and strain relief.
Techniques and systems for measuring three-dimensional shapes, depths, or surface profiles using optical principles, including diffraction, interferometry, structured light, and imaging.
Systems and methods for accurately measuring and compensating for position, orientation, and movement errors in mechanical systems, often for manufacturing, robotics, or optical alignment.
Methods and systems for accurately determining the absolute or relative position of an object or device, often integrating satellite navigation (GNSS), inertial measurement units (IMU), and local ranging or wireless communication technologies.
Systems and methods for maintaining and improving the quality of printed images, encompassing adjustments to developing bias based on environmental conditions, paper characteristic detection, and color profile generation.
Innovations in the physical design, materials, fabrication, or packaging of photodetectors and optical sensor elements, including thermoelectric, NIR-compliant, and self-mixing interference types, to improve performance or integration.
Technologies for non-contact measurement of distance, position, or 3D properties of a target object, often involving active emission and detection of light or radio frequency waves, including target tracking.
Techniques and apparatus for electrically testing semiconductor devices, integrated circuits, or wafers during manufacturing or post-assembly, including built-in self-test (BIST) and contact reliability assessment.
Systems and methods for uniquely identifying, tracking, and managing physical items using scannable codes (barcodes, QR codes) or wireless tags (RFID, IoT devices) to link physical objects to digital information, inventory, or services.
Methods and compositions for identifying, quantifying, or characterizing specific biological molecules (e.g., nucleic acids, proteins, metabolites, antibodies) or microbial species, often for diagnostic, prognostic, or quality control applications.
Methods and apparatus for detecting objects and determining their three-dimensional position and orientation (pose) using imagery or point cloud data, often for navigation, surveying, or environmental understanding.
Devices and methods for accurately measuring or monitoring electrical current draw and power usage in various systems, often for control, optimization, or safety purposes.
Techniques and hardware for autonomous systems to gather and interpret data about their surroundings, including obstacle detection, object recognition, and depth estimation, to inform control decisions.
Systems and methods for acquiring and analyzing image data across multiple discrete spectral bands or a continuous spectrum, often for material characterization, environmental monitoring, or remote sensing applications.
Techniques and apparatus utilizing various spectroscopy methods (e.g., Raman, NIRS, photometric, interferometric) for identifying substances, measuring concentrations, or monitoring chemical and physical processes in industrial, environmental, or laboratory settings.
Patents
Showing 1-7 of 7
Advanced Optical Sensor Components