Patent Theme
Advanced Material Characterization
Techniques and systems for precisely measuring electrical or electromagnetic properties of materials or components, often involving specialized resonators, waveguides, or multi-range measurement systems to ensure accuracy.
8,724 US filings from 2,812 companies since 2023 · 2023: 2,106 · 2024: 2,733 · 2025: 2,671 · 2026 YTD: 1,214
Electrical MeasurementSemiconductor Testing
Top companies
Ranked by filings in this theme since 2023. 2026 is partial.