Patent Theme
Optical & Image-based Metrology
Utilizing optical systems, cameras, and image processing algorithms for precise measurement of physical dimensions, alignment, defects, and features on semiconductor wafers or packages.
7,240 US filings from 1,715 companies since 2023 · 2023: 1,670 · 2024: 2,220 · 2025: 2,336 · 2026 YTD: 1,014
Semiconductor Testing
Top companies
Ranked by filings in this theme since 2023. 2026 is partial.